![Manual Manual](https://www.jtron-tech.com/files/RM320 image_2_1.jpg)
Title spare part no. 1: top hinge:: 2: hook of lock:: 3: sticker for front panel black:: 4: front panel black:: 5. UF200 PROBER MANUAL - BEST WAREZ OR NOT But if you re just getting started, you have nothing to lose if you try it out. Uf200 Prober Manual for Mac improves the performance of your machine by manually Whether you are winsome validating the ebook Uf200 Prober Manual in pdf upcoming, in that apparatus you retiring onto the evenhanded site.
Precio™ XL
Precio™ XL is the latest 300mm fully automated wafer prober developed based on TEL Precio™ series. The Precio™ XL realizes high productivity, contact performance, cleanliness improvement, and short delivery time with a concept to further reduce test costs. TEL has also provided high-speed probe mark inspection TELPADS™-I and Auto Leveling (the probe card parallelism Automatic adjustment function), Users have available to them ZOOM-I which supports various Z-axis control for stable contact and soft contact, as option. The Precio™ XL wafer prober is compatible with the wafer parameters of previous Precio™ models. In addition, focusing not only on test operations but also on efficiency of setup file generation, we have introduced CoSMOz (Contact Sequence Map Optimization) software option. CoSMOz has the capability to calculate the optimum contact sequence, which was previously performed by customer test engineers. We have realized significant improvement in work efficiency and improvement in test efficiency.
The following tools are currently being used:
Facilities for Functional Test on Integrated Circuits
288 digital channels (256 providing up to 800Mb/s datarate, 32 providing up to 1.6Gb/s)
4.1GS arbitrary waveform generator
320MS/1GHz digitizer
1x 8 channel device power supply (max 4A/channel)
2x 4 channel device power supply (max 8A/channel)
Additional software for memory test and scan test analysis
Supports manual package test and automatic wafer test (using the UF200 wafer prober)
4.1GS arbitrary waveform generator
320MS/1GHz digitizer
1x 8 channel device power supply (max 4A/channel)
2x 4 channel device power supply (max 8A/channel)
Additional software for memory test and scan test analysis
Supports manual package test and automatic wafer test (using the UF200 wafer prober)
Accretech UF200 wafer prober
Fully automatic wafer prober for up to 25 wafers/lot
Supports 6inch and 8inch wafers
Temperature controlled chuck, -40°C up to +125°C
Supports 6inch and 8inch wafers
Temperature controlled chuck, -40°C up to +125°C
256 digital channels (up to 125MHz)
4-channel Agilent power analyser
1 system configured for package test, the other system configured for wafer test
4-channel Agilent power analyser
1 system configured for package test, the other system configured for wafer test
Accretech UF200A wafer prober
Standard chuck (not temperature controlled)
![Uf200 Prober Manual Uf200 Prober Manual](/uploads/1/2/4/4/124424670/697910966.jpg)
Spectral range 7.5 .. 14µm
Temperature measurement range -40°C .. 1200°C
Image size 640x480
Temperature measurement range -40°C .. 1200°C
Image size 640x480
Accretech Uf200 Prober Manual
Standard lens 1.0/30 mm
image area (30 x 23)°,
minimum distance 300mm
Microscope objective 1,0x
Accretech Prober
image (16 x 12) mm²,
Uf200 Prober Manual Transmission
distance 50 mm, resolution 25µm
Online: up to 10 points
Offline: temperature of each pixel can be determined, additionally regions with min/max evaluation can be defined
Usage: e.g. detection of hot spots on chips (caused by shorts), thermal check of PCBs, etc
Online: up to 10 points
Offline: temperature of each pixel can be determined, additionally regions with min/max evaluation can be defined
Usage: e.g. detection of hot spots on chips (caused by shorts), thermal check of PCBs, etc